Tool on Built-in Self Test and Fault Diagnosis
BUILT-IN SELF TEST
Linear Feedback Shift Registers (LFSR) and other Pseudo-Random Pattern Generators (PRPG) have become one of the central elements used in test and self test of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. We have developed a training and research tool BIST Analyzer (BISTA) for learning basic and advanced issues related to PRPG-based test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR parameters. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The multi-platform JAVA runtime environment allows for easy access and usage of the tool both in a classroom and at home. The BISTA represents an integrated simulation, training, and research environment that supports both analytic and synthetic way of learning.
The tool set DIAGNOZER represents a multifunctional remote e-learning environment for teaching research by learning and investigating the problems of fault diagnosis in electronic systems. It is a collection of software tools which allow to simulate a system under diagnosis, emulate a pool of different methods and algorithms of fault location and analyze the efficiency of different embedded self-diagnosing architectures, and investigate the effect of real physical defects in electronic circuits. Both, fault model based and fault model free approaches to fault diagnosis as well as cause-effect and effect-cause techniques of fault location are supported in the presented environment. Also different embedded BIST and self diagnosis architectures are emulated to evaluate the efficiency of diagnosis.
Last update: September 2010