Learn the IEEE 1149.1 Boundary Scan Standard

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INTRODUCTION

On this page, you will find a training software that demonstrates main principles of testing printed circuit boards (PCB) using Boundary Scan test (BST) methodology. The software allows the user to experiment with built-in collection of components (ICs) and example boards, create own examples and save them for a later usage. To facilitate better understanding of the BS standard the trainig software has the following main working modes:

SHORT INTRO

Boundary-Scan test is a method for structural testing of printed circuit boards. The BST standard interface was designed for implementing many tasks like it is shown in the figure below.

Figure 1. Boundary-Scan Usage

The standard BS device includes the following three components:

The boundary scan architecture is shown in Figure 3.

 
Figure 2. TAP Controller Finite State Machine
Figure 3. Boundary-Scan Device Architecture
 

EXERCISES

APPLET DOCUMENTATION

LIST OF PUBLICATIONS:

WARNING: This page contains links to PDF files of articles that may be covered by copyright. You may browse the articles at your convenience. (in the same spirit as you may read a journal or a proceeding article in a public library). Retrieving, copying, or distributing these files, however, may violate the copyright protection law. We recommend that the user abides international law in accessing this directory.

  1. A. Jutman, A. Sudnitson, R. Ubar, “Web-Based Training System for Teaching Principles of Boundary Scan Technique”, in Proc. 14th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering, Gdansk, Poland, June 16-18, 2003
  2. A. Jutman, A. Sudnitson, R. Ubar, “Web-based Applet for Teaching Boundary Scan Standard IEEE 1149.1” in Proc. of 10th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES'03), Lodz, Poland, June 26-28, 2003, pp. 584-589
  3. A. Jutman, A. Sudnitson, R. Ubar, “Digital Design Learning System Based on Java Applets”, in Proc. 4th Annual Conference of the LTSN Centre for Information and Computer Sciences, NUI Galway, Ireland, August 26-28, 2003, pp.183-187

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Last update: 22 February, 2007