Learn the IEEE 1149.1 Boundary Scan Standard
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On this page, you will find a training software that demonstrates main principles of testing printed circuit boards (PCB) using Boundary Scan test (BST) methodology. The software allows the user to experiment with built-in collection of components (ICs) and example boards, create own examples and save them for a later usage. To facilitate better understanding of the BS standard the trainig software has the following main working modes:
- Design/Editing of the BS structures inside the target chip using the BSDL language (find large collection of BSDL files at www.BSDL.info)
- Design/Description of the target board that consists of several chips
- Simulation of work of the TAP controller, scan register and other BS registers
- Insertion and diagnosis of interconnection faults
Boundary-Scan test is a method for structural testing of printed circuit boards. The BST standard interface was designed for implementing many tasks like it is shown in the figure below.
Figure 1. Boundary-Scan Usage
The standard BS device includes the following three components:
- A serial test access port (TAP)
- A group of registers: boundary-scan register, instruction register (IR) and bypass register. Test data loads to registers through Test Data Input port (TDI) and comes out from Test Data Output port (TDO).
- A TAP controller, a 16-state finite state machine (Fig. 2) which has three main functions:
1. Loading the instructions in the IR;
2. Providing control signal to load and shift the test data into TDI and out of TDO;
3. Performing some test actions, such as capture, shift, and update test data.
The boundary scan architecture is shown in Figure 3.
Figure 2. TAP Controller Finite State Machine Figure 3. Boundary-Scan Device Architecture
LIST OF PUBLICATIONS:
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- A. Jutman, A. Sudnitson, R. Ubar, “Web-Based Training System for Teaching Principles of Boundary Scan Technique”, in Proc. 14th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering, Gdansk, Poland, June 16-18, 2003
- A. Jutman, A. Sudnitson, R. Ubar, “Web-based Applet for Teaching Boundary Scan Standard IEEE 1149.1” in Proc. of 10th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES'03), Lodz, Poland, June 26-28, 2003, pp. 584-589
- A. Jutman, A. Sudnitson, R. Ubar, “Digital Design Learning System Based on Java Applets”, in Proc. 4th Annual Conference of the LTSN Centre for Information and Computer Sciences, NUI Galway, Ireland, August 26-28, 2003, pp.183-187
Last update: 22 February, 2007