THEORY

1. Fault Modeling and Simulation
      1.1. Logical Fault Models
            1.1.1. Structural faults
      1.2. Fault Detection and Redundancy
            1.2.1. Fault detection in combinational circuits
            1.2.2. Detectability of faults
            1.2.3. Redundancy
      1.3. Fault Equivalence and Fault Location
            1.3.1. Fault equivalence classes
            1.3.2. Equivalence fault collapsing
            1.3.3. Fault location
      1.4. Fault Dominance
      1.5. Single Stuck-Fault Model
      1.6. Multiple Stuck-Fault Model
            1.6.1. The number of multiple faults
            1.6.2. Fault masking
            1.6.3. Circular fault masking
2. Test Generation
      2.1 Gate - level
      2.2 Functional level
3. Fault Diagnosis
      3.1. Basic Concepts
      3.2. Combinational Fault Diagnosis Methods
            3.2.1. Fault tables
            3.2.2. Fault dictionaries
            3.2.3. Minimization of diagnostic data
            3.2.4. Fault location by structural analysis
      3.3. Sequential Fault Diagnosis Methods
            3.3.1. Fault location by edge-pin testing
            3.3.2. Generating tests to distinguish faults
            3.3.3. Guided-probe testing
            3.3.4. Fault location by UUT reduction
4. Design for testability
5. Testing and Built-in self-test
6. Glossary
7. Useful materials

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Last update: 28 July, 2004