Usage of the Deterministic Test Pattern Generator


Generates deterministic tests for combinational circuits implementing the PODEM algorithm.
 
 

command: generate

input: SSBDD model file (.agm)
output: test pattern file (.tst), list of redundant faults (.red)
 
syntax: generate [options] <design>
 
design:
Name of the design file without .agm extension.
   
options:  
­backtracks <number>
Maximal number of backtracks. Default is 10.
­vector_limit <limit>
Maximal number of generated patterns. Default is 1000.
­fault_table
Perform fault simulation for the final patterns.

 

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