A random test
generator for combinational circuits. Generates random patterns in packages
of 32 vectors. Best vectors are included to the final test set.
command: | random |
input: | SSBDD model file (.agm) |
output: | test pattern file (.tst) |
syntax: | random [options] <design> |
design: | Name of the design file without .agm extension. |
options: | |
failure_limit <limit> | Maximal number of consecutive failed packages. Default is 64. |
pack_size <size> | The number of vectors in a package is size multiplied by 32. Default for size is 1. |
criterion <faults> | Vectors detecting more previously undetected faults than specified by faults will be selected. Default for faults is 1. |
packages <packages> | Maximal number of packages to be simulated. Default is 1000. |
select_max <vectors> | Maximal number of vectors selected from a package. Default is 32. |
fault_table | Perform fault simulation for the final patterns. |