A random test 
  generator for combinational circuits. Generates random patterns in packages 
  of 32 vectors. Best vectors are included to the final test set. 
    
    
| command: | random | 
| input: | SSBDD model file (.agm) | 
| output: | test pattern file (.tst) | 
| syntax: | random [options] <design> | 
| design: | Name of the design file without .agm extension. | 
| options: | |
| failure_limit <limit> | Maximal number of consecutive failed packages. Default is 64. | 
| pack_size <size> | The number of vectors in a package is size multiplied by 32. Default for size is 1. | 
| criterion <faults> | Vectors detecting more previously undetected faults than specified by faults will be selected. Default for faults is 1. | 
| packages <packages> | Maximal number of packages to be simulated. Default is 1000. | 
| select_max <vectors> | Maximal number of vectors selected from a package. Default is 32. | 
| fault_table | Perform fault simulation for the final patterns. | 
