Scientific publications

1. Lembit Jürimägi, Adeboye Stephen Oyeniran, Maksim Jenihhin, Raimund Ubar. Application Specific True Critical Paths Identification in Sequential Circuits. 25th IEEE International Symposium on On-Line Testing and Robust System Design - IOLTS, July 1-3, 2019.

2. R.Ubar, L.Jürimägi, A. Adekoya, MJenihhin. True Path Tracing in Structurally Synthesized BDDs for Controllability Analysis of Digital Circuits. Euromicro Conference on Digital System Design - DSD, Kallithea, Chalkidiki, Greece, Aug. 28 - 30, 2019.