Java Applets on Various Aspects of Decomposition and Test of Digital Systems

Testing & Diagnostics
	Basics of Test & Diagnostics Applet supports action-based learning the basics of Digital Test. It offers a set of tools for understanding the principles of test generation, fault simulation, fault diagnosis and fault location in digital circuits. Built-in library of simple combinational circuits is given to train on the screen the main important techniques and algorithms
	RT-Level Test & BIST Applet allows to solve and illustrate many RT-level problems of design and test of control intensive digital systems. Such topics as investigation of tradeoffs between speed and hardware cost in digital design, RT-level simulation, fault simulation, test generation, different techniques of built-in self-test (BIST) and other similar are covered by the applet
	Boundary Scan Applet demonstrates principles of testing chips and boards, which have Boundary Scan structures inside. It simulates fault insertion and diagnosis, provides possibilities of combining own boards using built-in chip library or user imported chips
	Tool on Built-in Self Test and Fault Diagnosis Dedicated tool set for learning Built-in Self-Test (BIST) and fault diagnosis problems.
Decomposition & Synthesis
	Multiplicative Decomposition Applet is devoted to general method of decomposition of FSM and enables synthesis of the network of interacting sub-FSMs corresponding to a complete set of partitions on the set of states of source FSM. We call this method of decomposition as multiplicative decomposition, because the graph of the prototype FSM is embedded into a product of smaller graphs
	Additive Decomposition Applet demonstrates additive decomposition, wherein the graph of the FSM is partitioned into node disjoint subsets. The network of interacting sub-FSMs corresponding to a given partition on the set of states of source FSM. The network of FSMs consists of components working alternatively in time, i.e. all components except one are suspended in one of extra state (the “wait” state)
	Generalized Additive Decomposition Applet enables to decompose prototype machine with distribution of micro-operations among sub-machines that is not possible to achieve using alternative approach. To construct such network we apply the method of decomposition that proceeds from a given cover (not a partition) on the set of states of prototype FSM
	Stochastic FSM State Encoder Stochastic FSM Encoder is a tool that performs FSM state assignment based on the results of stochastic analysis. The main goal of the state encoding algorithm is to minimize the Hamming distance between adjacent states that have higher transition probability. The tool consist of steady state probability calculation module and state encoding unit. The software supports FSM description in KISS2 format.
	Supplementary applets
Digital Design
	RT-Level Test & BIST Applet allows to solve and illustrate many RT-level problems of design and test of control intensive digital systems. Such topics as investigation of tradeoffs between speed and hardware cost in digital design, RT-level simulation, fault simulation, test generation, different techniques of built-in self-test (BIST) and other similar are covered by the applet
	Schematic & DD Editor