INTRODUCTION

Testing and Diagnosis

Testing of a system is an experiment in which the system is exercised and its resulting response is analysed to ascertain whether it behaved correctly. If incorrect behavior is detected, the second goal of a testing experiment is a diagnose, or locate, the cause of the misbehavior.

Errors and Faults

An instance of an incorrect operation of the system being tested is referred to as an error. The causes of the observed errors may be design errors or physical faults. In general, physical faults do not allow a direct mathematical treatment of testing and diagnosis. The solution is to deal with logical faults (or fault models), which are a convenient representation of physical faults.

SELECTED PUBLICATIONS:

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  1. Ubar, R., Orasson, E., Wuttke, H.-D. Interactive Teaching Software "Introduction To Digital Test". 45th International Conference, Ilmenau, Germany, 2000, p.949-954
  2. Ubar, R., Wuttke, H.-D. Action Based Learning System for Teaching Digital Electronics and Test. Proc. of 3rd European Workshop on Microelectronics Education, Aix-en-Provence, France, 2000, p.65-66
  3. Ubar,R., Wuttke,H.-D. The DILDIS-Project - Using Applets for More Demonstrative Lectures in Digital Systems Design and Test. Abstracts of 31st ASEE/IEEE Frontiers in Education Conference, Reno, NV, USA, 2001, p.83
  4. Ubar,R., Orasson,E., Evartson,T. Java Applet for Self-Learning of Digital Test Issues. 13th EAEEIE Conference, York, Great Britain, 2002
  5. Ubar,R., Orasson,E., Evartson,T. Self-learning tool for digital test. Proceedings of 2nd Int. Conf. "Distance learning - educational sphere of the XXI century", Minsk, Belarus, 2002, p.36-38
  6. A. Jutman, M. Kruus, A. Sudnitson, and R.Ubar, “Distance-Learning Tools for Digital Design and Test Issues,” in Proc. 29th International Conference and Scientific Discussion Club “Information Technologies in Science, Education, Telecommunications, Business” (IT+SE’2002), Yalta-Gurzuf, Ukraine, May 20-30, 2002, pp. 269-272
  7. S. Devadze, A. Jutman, A. Sudnitson, R. Ubar, “Web-based training system for teaching basics of RT-level Digital Design, Test, and Design for Test,” in Proc. of 9th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES 2002), Wroclaw, Poland, June 20-22, 2002, pp. 699-704
  8. S. Devadze, A. Jutman, M. Kruus, A. Sudnitson, and R.Ubar, “Web Based Tools for Synthesis and Testing of Digital Devices”, in Proc. International Conference on Computer Systems and Technologies (CompSysTech’2002), Sofia, Bulgaria, June 20-21, 2002, pp. I.91-I.96. (ISBN 954-9641-28-7)
  9. S. Devadze, A. Jutman, A. Sudnitson, R. Ubar, H-D. Wuttke, “Java Technology Based Training System for Teaching Digital Design and Test,” in Proc. of 8th Baltic Electronics Conference (BEC 2002), Tallinn, Estonia, October 6-9, 2002, pp. 283-286
  10. S. Devadze, A. Jutman, A. Sudnitson, R. Ubar, H-D. Wuttke, “Teaching Digital RT-Level Self-Test using a Java Applet,” 20th IEEE Conference NORCHIP’2002, Copenhagen, Denmark, November 11-12, 2002, pp.322-328
  11. Ubar, R., Orasson, E. E-Learning tool and Exercises for Teaching Digital Test.. Proc.of 2nd IEEE Conf. on Signals, Systems, Decision and Information Technology., Sousse, Tunisia, 2003, CIT-6, p.1-6
  12. A. Jutman, A. Sudnitson, R. Ubar, “Web-Based Training System for Teaching Principles of Boundary Scan Technique”, in Proc. 14th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering, Gdansk, Poland, June 16-18, 2003
  13. A. Jutman, A. Sudnitson, R. Ubar, “Web-based Applet for Teaching Boundary Scan Standard IEEE 1149.1” in Proc. of 10th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES'03), Lodz, Poland, June 26-28, 2003, pp. 584-589
  14. A. Jutman, A. Sudnitson, R. Ubar, “Digital Design Learning System Based on Java Applets”, in Proc. 4th Annual Conference of the LTSN Centre for Information and Computer Sciences, NUI Galway, Ireland, August 26-28, 2003, pp.183-187
  15. M.Aarna, E.Ivask, A.Jutman, E.Orasson, J.Raik, R.Ubar, V.Vislogubov, H.-D.Wuttke, “Turbo Tester - Diagnostic Package for Research and Training”, in Scientific-Technical Journal “Radioelectronics & Informatics”. KNURE. Vol. 3(24), 2003, pp.69-73

TEXTBOOKS:

  1. M. Abramovici, M.A. Breuer, A.D. Friedman. Digital Systems Testing and Testable Designs. 1990
  2. S. Mourad, Y. Zorian. Principles of Testing Electronic Systems. John Wiley & Sons, Inc., New York, 2000
  3. John L. Hennessy, David A. Patterson. Computer Organization and Design. San Francisco, California, 1997
  4. J. Rajski, J. Tyszer. Arithmetic Built-In Self-Test for embedded systems. New Jersey, 1998
  5. M. Bushnell, V. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits.Kluwer Academic Publishers. Norwell, USA, 2000

Last update: 27 July, 2004