Generates test for combinational circuits.
| input: | SSBDD model file (.agm) | |
|---|---|---|
| output: | Test pattern file (.tst), list of redundant faults (.red) | |
| syntax: | generate [options] <design> | |
| arguments: | design | Name of the design file without .agm extension |
| options: | -PODEM | Apply PODEM algorithm. By default a more advanced test generation algorithm is chosen. |
| -backtracks <number> | Maximal number of backtracks. Default is 10. | |
| -vector_limit <limit> | Maximal number of generated patterns. Default is 1000. | |
| -fault_table | Perform fault simulation for the final patterns. | |
No Error Conditions defined
| 0 | Success |
|---|---|
| 1 | Error |
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