Generates test for combinational circuits utilizing algorithm working on Genetic Algorithms (GAs).
| input: | SSBDD model file (.agm) | |
|---|---|---|
| output: | Test pattern file (.tst) | |
| syntax: | genetic <mutation_rate1> <population_size> <timeout> <mutation_rate2> <max_generations> <design> | |
| arguments: | design | Name of the design file without .agm extension |
| mutation_rate1 | Initial mutation rate (recommended range 0.01 ... 0.1) | |
| population_size | Number of vectors in a population. Has to be an even value. (Suggested value is 32) | |
| timeout | The smaller the value the more thoroughly we will search. (Suggested value is 0.1) | |
| mutation_rate2 | Mutation rate applied when fitness value becomes zero. (Recommended range 0.1 ... 0.5) | |
| max_generations | Maximum number of generations | |
No Error Conditions defined
| 0 | Success |
|---|---|
| 1 | Error |
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