A random test generator for combinational circuits. Generates random patterns in packages of 32 vectors. Best vectors are included to the final test set.
| input: | SSBDD model file (.agm) | |
|---|---|---|
| output: | Test pattern file (.tst) | |
| syntax: | random [options] <design> | |
| arguments: | design | Name of the design file without .agm extension |
| options: | -failure_limit <limit> | Maximal number of consecutive failed packages. Default is 64 |
| -pack_size <size> | The number of vectors in a package is size multiplied by 32. Default for size is 1 | |
| -criterion <faults> | Vectors detecting more previously undected faults than specified by faults will be selected. Default for faults is 1 | |
| -packages <packages> | Maximal number of packages to be simulated. Default is 1000 | |
| -select_max <vectors> | Maximal number of vectors selected from a package. Default is 32 | |
| -fault_table | Perform fault simulation for the final patterns | |
No Error Conditions defined
| 0 | Success |
|---|---|
| 1 | Error |
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