1. Fault Modeling and Simulation
2. Test Generation
3. Fault Diagnosis
4. Design for Testability
5. Testing and Built-in Self-Test
6. Glossary
7. Useful Materials

6. GLOSSARY

A B C D E F G I L M N O P R S T

A
activate
 
B
bottom-up approach
bridging faults
 
C
circular fault masking
combinational fault diagnosis methods
complete fault-location test
complete location test
 
D
detectability of faults
diagnostic data
diagnostic resolution
 
E
edge-pin testing
equivalence classes
equivalence fault collapsing
explicit faults
 
F
fanout- free circuits
Fault

activation

detection and redundancy

detection in combinational circuits

diagnosis

dictionary

dominance

effect

equivalence

equivalence classes

location

by Edge-Pin Testing

by Structural Analysis

by UUT Reduction

masking

modelling and simulation

propagation

table
Faults

bridging faults

detectability

explicit faults

functional faults

implicit faults

logical fault

redundant faults

structural faults

functionally equivalent faults (FEF)
 
G
gate- level fault- oriented test generation
generating tests to distinguish faults
guided-probe testing
 
I
implicit faults
irreduntant circuit
 
L
line justification
logical fault
 
M
maximal fault resolution
minimization of diagnostic data
multiple stuck-fault model
 
N
the number of multiple faults
 
O
open
 
P
propagate
 
R
redundancy
replaceable units RU
rule of 10
 
S
sensitized path
sequential diagnosis procedure
sequential fault diagnosis methods
a short
single stuck-fault model
structural faults
stuck at
 
T
test generation
test vector
top-down approach

A B C D E F G I L M N O P R S T

Construction of an Abstract Network
Back to List

Last update: 28 July, 2004